dc.contributor.author | Greenberger, Rebecca N. | |
dc.contributor.author | Mustard, John F. | |
dc.contributor.author | Ehlmann, Bethany L. | |
dc.contributor.author | Blaney, Diana L. | |
dc.contributor.author | Cloutis, Edward A. | |
dc.contributor.author | Wilson, Janette H. | |
dc.contributor.author | Green, Robert O. | |
dc.contributor.author | Fraeman, Abigail A. | |
dc.date.accessioned | 2018-03-06T19:23:21Z | |
dc.date.available | 2018-03-06T19:23:21Z | |
dc.date.issued | 2015-12-01 | |
dc.identifier.citation | Greenberger, R. N., J .F. Mustard, B. L. Ehlmann, D .L. Blaney, E. A. Cloutis, J. H. Wilson, R. O. Green, and A. A. Fraeman. "Imaging spectroscopy of geological samples and outcrops: Novel insights from microns to meters." GSA Today 25 (2015): 4-10. DOI: 10.1130/GSATG252A.1. | en_US |
dc.identifier.issn | 1052-5173 | |
dc.identifier.uri | http://hdl.handle.net/10680/1385 | |
dc.description.abstract | Imaging spectroscopy is a powerful, non-destructive mineralogic tool that provides insights into a variety of geological processes. This remote measurement technique has been used for decades from orbital or aerial platforms to characterize surface compositions of Earth and other solar system bodies. These instruments have now been miniaturized for use in the laboratory and field, thereby enabling petrologic analyses of samples and
outcrops. Here, we review the technique and present four examples showing the exciting science potential and new insights into geological processes. | en_US |
dc.description.sponsorship | Portions of this research were carried out at the Jet Propulsion Laboratory, California Institute of Technology, under a contract with the National Aeronautics and Space Administration. | |
dc.description.uri | http://www.geosociety.org/gsatoday/archive/25/12/abstract/i1052-5173-25-12-4.htm | |
dc.language.iso | en | en_US |
dc.publisher | GSA Today | en_US |
dc.rights | info:eu-repo/semantics/openAccess | |
dc.title | Imaging spectroscopy of geological samples and outcrops: Novel insights from microns to meters | en_US |
dc.type | | |
dc.type | Article | |
dc.identifier.doi | 10.1130/GSATG252A.1 | |